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| Margaret Burke | ||
| mburke@ellacheong.com |
United States Patent Attorney
New York State Bar Member
Margaret Burke graduated from the Massachusetts
Institute of Technology (MIT-United States) with a Bachelor of Science
degree in Materials Engineering in 1986, focusing on semiconductors and
other materials for electronic applications. She also undertook
substantial coursework in mechanical engineering. She completed Juris
Doctor and Master of Laws in Intellectual Property degrees at
Margaret has served at the United States Patent &
Trademark Office as both a Chemical Patent Examiner and as an Electrical
Patent Examiner. She also has extensive experience working in-house as a
Patent Attorney and as Intellectual Property Counsel in private
technological institutions such as AT&T Bell Laboratories, Ciena Corporation
and Seneca Networks. Margaret also has international experience as a patent
attorney for six years at a Tokyo IP law firm, Taiyo, Nakajima, & Kato.
Her patent prosecution experience and opinion
work covers a wide range of technologies including the technical fields of
displays, photographic materials, imaging devices, printers, cameras,
automotive parts, semiconductors, microelectronic devices, fiber optic
systems, and biomedical devices. She has also engaged in intellectual
property strategy, patent portfolio development, product design review, and
review of existing patents in a wide range of technologies.
Margaret‘s working language is English.
Qualifications
Juris Doctor (J.D.),
Master of Laws (LL.M.),
B.Sc. (Materials Engineering),
Massachusetts Institute of Technology (